CVE-2018-13888

high

Description

There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605.

References

https://www.qualcomm.com/company/product-security/bulletins

http://www.securityfocus.com/bid/106475

Details

Source: Mitre, NVD

Published: 2019-02-11

Updated: 2019-02-14

Risk Information

CVSS v2

Base Score: 7.2

Vector: CVSS2#AV:L/AC:L/Au:N/C:C/I:C/A:C

Severity: High

CVSS v3

Base Score: 7.8

Vector: CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H